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ATOMIC FORCE MICROSCOPE

ATOMIC FORCE MICROSCOPE

ATOMIC FORCE MICROSCOPE

ATOMIC FORCE MICROSCOPE

ATOMIC FORCE MICROSCOPE

ATOMIC FORCE MICROSCOPE

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AFM is one of the most widely used tools in the SPM family for surface observation and research. Its working principle is based on the interaction forces between atoms. When a very sharp microprobe approaches the sample surface in the vertical direction sufficiently to an interval of several nanometers or even less, an atomic force is generated between the atoms at the tip of the microprobe and the atoms on the sample surface. There is a curve relationship between the magnitude of the atomic force and the interval. At the starting stage with a large interval, the atomic force is expressed as a gravitational force, which turns to a repulsive force as the spacing decreases further due to the mutual overlap of the valence electron clouds and the interaction between the charges of the two nuclei. This repulsive force increases sharply as the interval decreases, and AFM uses these relationships between the atomic forces and the spacing to obtain the microscopic shape of the sample surface by detecting the interatomic forces.


The unique features of our AFM are the unique horizontal probe structure, which makes the direction of atomic forces vertical to the direction of gravity without interfering with each other; reduces the overall center of gravity of the probe; overcomes the vertical creep of the original coarse and fine tuning approximation mechanism; and has a unique horizontal visualization optical path. Probe and instrument performance is more stable and superior.

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